X-ray analytical techniques probe the chemical structure and composition of materials through their interaction with light in the X-ray region of the spectrum. X-ray analysis provides detailed insight into key material and chemical properties, such as phase analysis of materials, protein and nucleic acid structures, and atomic composition. Many different types of X-ray analytical instruments are available, including:
- X-ray fluorescence (XRF), a non-destructive analytical technique used to determine the elemental composition of materials
- X-ray diffraction (XRD), a versatile and non-destructive analytical technique that reveals detailed structural and chemical crystallography of materials
- X-ray absorption spectroscopy (XAS), which can determine the local atomic structure and electronic states of atoms
- X-ray emission spectroscopy (XES), which provides information about the local electronic structure
- X-ray Auger electron spectroscopy (XAES) and X-ray photoelectron spectroscopy (XPS), which are surface-sensitive techniques to determine the chemical structure of surface layers