Hitachi S-2460N Scanning Electron Microscope (SEM)

Angstrom Scientific Inc. represents a number of leading manufacturers who provide materials characterization and analysis solutions. These include Hitachi Tabletop SEMs, Imina Nano-probing systems, Point Electronics EBIC/EBAC, Leica Sample preparation equipment, NenoVision In-Situ AFM, Alemnis In-Situ Nano-Indenters, EMSIS TEM Cameras, and Laser Thermal - Thermal Property Management tools.Additionally, Angstrom Scientific provides field service, contract testing, and general technical support for all of our products.